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Статьи в журналах
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- 2018 Local structural analysis of In-doped Bi2 Se3 topological insulator using X-ray fluorescence holography
- Kimura Koji, Hayashi Koichi, Yashina Lada V., Happo Naohisa, Nishioka Takumi, Yamamoto Yuta, Ebisu Yoshihiro, Ozaki Toru, Hosokawa Shinya, Matsushita Tomohiro, Tajiri Hiroo
- в журнале Surface and Interface Analysis, издательство John Wiley & Sons Inc. (United States) DOI