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Тезисы докладов
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- 2020 From first STM to complex analysis systems - 30 years' experience of R&D and production of metrological equipment
- Bykov Victor, Polyakov Vyacheslav, Bykov Andrey V., Kotov Vladimir, Leesment Stanislav, Bobrov Yuri
- в сборнике Fifth Asian School-Conference on Physics and Technology of Nanostructured Materials ASCO-NANOMAT 2020, место издания Dalnauka Publishing г. Владивосток, тезисы