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Статьи в журналах
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- 2021 Raman Spectroscopy-Based Quality Control of “Silicon-On-Insulator” Nanowire Chips for the Detection of Brain Cancer-Associated MicroRNA in Plasma
- Kozlov Andrey F., Shumov Ivan D., Larionov Dmitry I., Tikhonenko Fedor V., Kapustina Svetlana I., Ziborov Vadim S., Petrov Oleg F., Gadzhieva Olga A., Bashiryan Boris A., Shimansky Vadim N., Archakov Alexander I., Ivanov Yuri D.
- в журнале Sensors, издательство MDPI (Basel, Switzerland), том 21, № 1333, с. 1-13